ESPEC HAST - Highly Accelerated Stress Test Chambers
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks. Our HAST systems have a modern design that's easier to use: